Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10816482 | High throughput, high resolution optical metrology for reflective and transmissive nanophotonic devices | S. Sreenivasan, Brian Gawlik | 2020-10-27 |
| 10717646 | Precision alignment of the substrate coordinate system relative to the inkjet coordinate system | Sidlgata V. Sreenivasan | 2020-07-21 |