Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10670654 | Probe card and wafer testing system and wafer testing method | Yuan-Chun Wu, Chang Xu | 2020-06-02 |
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Ni SHEN
Overall (2020): #329,268 of 565,922Top 60%
1
Patents 2020