Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10746542 | Line edge roughness analysis using atomic force microscopy | Wei-Shan Hu, Dong Gui, Jang Jung Lee, Duen-Huei Hou, Wen-Chung Liu | 2020-08-18 |
CL
Che-Liang Li
Overall (2020): #515,892 of 565,922Top 95%
1
Patents 2020