Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10619997 | Method for measuring thickness variations in a layer of a multilayer semiconductor structure | — | 2020-04-14 |
| 10608610 | Substrate for a temperature-compensated surface acoustic wave device or volume acoustic wave device | Marcel Broekaart, Thierry Barge, Pascal Guenard, Ionut Radu, Eric Desbonnets | 2020-03-31 |