Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10790200 | Wafer measurement apparatus, wafer measurement system, and method of manufacturing semiconductor device using the same | Je Hyun Lee | 2020-09-29 |
| 10727025 | System and method of analyzing a crystal defect | Il Gyou Shin, Seon Young Lee, Alexander Schmidt, Shin-Wook Yi | 2020-07-28 |