Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10653376 | X-ray imaging system | Wenbing Yun, Janos Kirz, Alan Francis Lyon | 2020-05-19 |
| 10656105 | Talbot-lau x-ray source and interferometric system | Wenbing Yun, Janos Kirz, David Vine | 2020-05-19 |
| 10658145 | High brightness x-ray reflection source | Wenbing Yun, Janos Kirz, William H. Hansen | 2020-05-19 |
| 10578566 | X-ray emission spectrometer system | Wenbing Yun, Srivatsan Seshadri, Janos Kirz | 2020-03-03 |