Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10837831 | Inspection apparatus, inspection system, and inspection method | Satoshi Oguchi, Ryohei KURI | 2020-11-17 |
| 10677654 | Measurement device, electronic apparatus, and measurement method | Hideaki Kasahara | 2020-06-09 |
| 10661587 | Test pattern creation method, test pattern, printing apparatus, and program | — | 2020-05-26 |