Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10871515 | Method of measuring Fe concentration in p-type silicon wafer | Shinya Fukushima | 2020-12-22 |
| 10552106 | Viewing control server and viewing control method | — | 2020-02-04 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10871515 | Method of measuring Fe concentration in p-type silicon wafer | Shinya Fukushima | 2020-12-22 |
| 10552106 | Viewing control server and viewing control method | — | 2020-02-04 |