Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10622265 | Method of detecting failure of a semiconductor device | Ji Young Choi, Zhan Zhan, Min Seob KIM, Ju Hyun Kim, Hwa-Sung Rhee | 2020-04-14 |
| 10600702 | Test element group and semiconductor wafer including the same | Zhan Zhan, Ju Hyun Kim, Hwa-Sung Rhee | 2020-03-24 |