Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10564134 | Pseudo defect sample, process for producing the same, method for adjusting ultrasonic flaw detection measurement condition, method for inspecting target material, and process for producing sputtering target | Koji Nishioka | 2020-02-18 |