Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10872743 | Sample holding mechanism, manufacturing method for same, and charged particle beam device | Akira Sugawara, Yoshio Takahashi, Toshiaki Tanigaki | 2020-12-22 |
| 10629410 | Electron microscope for magnetic field measurement and magnetic field measurement method | Toshiaki Tanigaki, Akira Sugawara | 2020-04-21 |