Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876978 | X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curve | Kiyoshi Ogata, Sei Yoshihara, Yoshiyasu Ito, Hiroshi Motono, Hideaki Takahashi +9 more | 2020-12-29 |
| 10854348 | X-ray generator and x-ray analysis device | Takeshi Osakabe, Tetsuya Ozawa, Licai Jiang, Boris Verman | 2020-12-01 |
| 10598616 | X-ray reflectometer | Satoshi Murakami, Shinya Kikuta, Akihiro Ikeshita | 2020-03-24 |