Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10664370 | Multiple core analysis mode for defect analysis | Kenji Shiozawa, Yoshihide Nakamura, Takuya LEE, Tetsuya Kokubun, Hiroyuki Sasaki | 2020-05-26 |
| 10656201 | Semiconductor device | Takuya LEE, Tetsuya Kokubun, Kenji Shiozawa, Yoshihide Nakamura | 2020-05-19 |