Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10878554 | Defect detection and measurement method | Kenneth A. Frisk | 2020-12-29 |
| 10832395 | Systems and methods for inspecting bristles using a digital camera | Kamiko L. Darrow, Brian Duguay, Erik M. Pedersen, Brian Ricciardelli, Danielle N. Balzano | 2020-11-10 |
| 10678206 | Remote feature measurement | John Quitter | 2020-06-09 |