Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10831577 | Abnormality detection system, abnormality detection method, abnormality detection program, and method for generating learned model | Kenta Oono | 2020-11-10 |
| 10807235 | Machine learning device, robot controller, robot system, and machine learning method for learning action pattern of human | Taketsugu Tsuda, Ryosuke Okuta, Eiichi Matsumoto, Keigo Kawaai | 2020-10-20 |
| 10717196 | Machine learning device, robot system, and machine learning method for learning workpiece picking operation | Takashi Yamazaki, Takumi Oyama, Shun SUYAMA, Kazutaka Nakayama, Hidetoshi Kumiya +4 more | 2020-07-21 |