Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10867873 | Method and device for measurement of a plurality of semiconductor chips in a wafer array | Roland Zeisel, Anton Vogl, Jens Ebbecke | 2020-12-15 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10867873 | Method and device for measurement of a plurality of semiconductor chips in a wafer array | Roland Zeisel, Anton Vogl, Jens Ebbecke | 2020-12-15 |