Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10816951 | Emulation of a control system and control method for abnormality detection parameter verification | Yutaka Abe, Shinsuke KAWANOUE, Yuki Ueyama | 2020-10-27 |
| 10795338 | Abnormality detection system, support device, and model generation method | Shinsuke KAWANOUE | 2020-10-06 |