Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10753860 | Inspection apparatus, inspection method, and program | Yoshihiro Murakami, Masatoshi Takashima | 2020-08-25 |
| 10750084 | Image processing apparatus and image processing method | Haruka Asai, Hideho Une | 2020-08-18 |