Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10809208 | X-ray inspection device, X-ray inspection method, and method of manufacturing structure | Takahiro Michimoto, Naoshi Sakaguchi | 2020-10-20 |
| 10809209 | Measurement processing device, x-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing method | Fuminori Hayano, Akitoshi Kawai | 2020-10-20 |