IH

Ian George Haig

NN Nikon Metrology Nv: 1 patents #4 of 6Top 70%
Overall (2020): #441,635 of 565,922Top 80%
1
Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10614990 Target assembly for an x-ray emission apparatus and x-ray emission apparatus — 2020-04-07