KO

Katsuhiro Ochiai

NE Nec: 5 patents #76 of 910Top 9%
Overall (2020): #34,624 of 565,922Top 7%
5
Patents 2020

Issued Patents 2020

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
10788817 Manufacturing process analysis device, manufacturing process analysis method, and recording medium whereupon manufacturing process analysis program is stored Takazumi Kawai 2020-09-29
10761076 Determination risk of natural disaster based on moisture content information Ryota Mase 2020-09-01
10719778 Anomaly detection based on relational expression between vibration strengths at various frequencies 2020-07-21
10697861 Structure abnormality detection device, structure abnormality detection method, storage medium, and structure abnormality detection system Ryota Mase, Shinji Kasahara 2020-06-30
10641681 Structure abnormality detection system, structure abnormality detection method, and storage medium Ryota Mase 2020-05-05