Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10539560 | Substrate for sample analysis, and sample analysis apparatus | Masayuki Saiki, Fusatoshi Okamoto, Kazuya Kondoh | 2020-01-21 |
| 10539582 | Substrate for sample analysis, sample analysis device, sample analysis system, and method for removing liquid from liquid that contains magnetic particles | Fusatoshi Okamoto | 2020-01-21 |
| 10539583 | Substrate for sample analysis, sample analysis device, sample analysis system, and program for sample analysis system | Fusatoshi Okamoto | 2020-01-21 |