Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10725086 | Evaluation apparatus of semiconductor device and method of evaluating semiconductor device using the same | Takaya Noguchi | 2020-07-28 |
| 10539607 | Evaluation apparatus including a plurality of insulating portions surrounding a probe and semiconductor device evaluation method based thereon | Kinya YAMASHITA, Masaki Ueno | 2020-01-21 |