Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10782252 | Apparatus and method for X-ray analysis with hybrid control of beam divergence | Detlef Beckers | 2020-09-22 |
| 10753890 | High resolution X-ray diffraction method and apparatus | Detlef Beckers, Alexander Kharchenko, Eugene Reuvekamp | 2020-08-25 |