Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10796428 | Inspection system and inspection method | Won Mi AHN, Hye In Lee, Jong Hui LEE | 2020-10-06 |
| 10672116 | Substrate inspection method and system | Yeon Hee Lee, Won Mi AHN, Hye In Lee, Jong Hui LEE | 2020-06-02 |
| 10650510 | Substrate inspection apparatus and method | Yeon Hee Lee, Won Mi AHN, Hye In Lee, Jong Hui LEE | 2020-05-12 |