Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10785394 | Imaging performance optimization methods for semiconductor wafer inspection | Jeremy Nesbitt, Joshua Knight, Vadim Palshin, Suneet Luniya, Kevin Lai +2 more | 2020-09-22 |