Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10867877 | Targeted recall of semiconductor devices based on manufacturing data | David W. Price | 2020-12-15 |
| 10761128 | Methods and systems for inline parts average testing and latent reliability defect detection | David W. Price, Robert Cappel, Kara L. Sherman, Douglas Sutherland | 2020-09-01 |