Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10767977 | Scattered radiation defect depth detection | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2020-09-08 |
| 10769769 | Dual mode inspector | Steven W. Meeks, Rusmin Kudinar, Ronny Soetarman, James Jianguo Xu | 2020-09-08 |
| 10648928 | Scattered radiation optical scanner | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2020-05-12 |
| 10641713 | Phase retardance optical scanner | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2020-05-05 |