Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10872406 | Hot spot defect detecting method and hot spot defect detecting system | Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung +6 more | 2020-12-22 |
| 10809635 | Defect inspection method and defect inspection system | Hung-Yi Chung, Chao-Ting Hong, Cheng-Kuang Lee, Xiaomeng Chen, Teng-Cheng Hsu | 2020-10-20 |