EW

Etienne Waelkens

KR Katholieke Universiteit Leuven, Ku Leuven R&D: 1 patents #14 of 63Top 25%
VU Vanderbilt University: 1 patents #60 of 261Top 25%
📍 Rotselaar, BE: #1 of 4 inventorsTop 25%
Overall (2020): #477,388 of 565,922Top 85%
1
Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10540536 System for interpretation of image patterns in terms of anatomical or curated patterns Richard Caprioli, Bart De Moor, Raf Van De Plas, Nico Verbeeck 2020-01-21