Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10859533 | Parameter estimation method and parameter estimation device | Akiko Hirao, Satoshi Takayama, Tomio Ono, Noriko Yamamoto, Yasuharu Hosono +2 more | 2020-12-08 |
| 10689216 | Inspection device and inspection method | Yasuharu Hosono, Tomio Ono | 2020-06-23 |