Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10607335 | Systems and methods of using absorptive imaging metrology to measure the thickness of ophthalmic lenses | Michael F. Widman, Peter W. Sites, D. Scott Dewald, Bradley W. Walker | 2020-03-31 |