Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10755888 | Aberration corrector and charged particle beam device | — | 2020-08-25 |
| 10720302 | Electron microscope | Takeo Sasaki, Tomohiro Nakamichi | 2020-07-21 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10755888 | Aberration corrector and charged particle beam device | — | 2020-08-25 |
| 10720302 | Electron microscope | Takeo Sasaki, Tomohiro Nakamichi | 2020-07-21 |