Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10720301 | Aberration corrector and electron microscope | — | 2020-07-21 |
| 10541111 | Distortion measurement method for electron microscope image, electron microscope, distortion measurement specimen, and method of manufacturing distortion measurement specimen | Yuji Konyuba, Kazuya Omoto | 2020-01-21 |