Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876974 | Inspection device, inspection system, and inspection method | Yoshikazu Wakizaka, Satoshi Uchida, Eiko Erika Kato, Masayo Takano | 2020-12-29 |
| 10766040 | Analysis device and separation device | Yoshikazu Wakizaka, Masayo Takano, Takayuki ITOI, Masakazu Toi, Tomomi NISHIMURA | 2020-09-08 |