Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10840058 | Aberration measurement method and electron microscope | Akiho Nakamura | 2020-11-17 |
| 10714308 | Measurement method and electron microscope | — | 2020-07-14 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10840058 | Aberration measurement method and electron microscope | Akiho Nakamura | 2020-11-17 |
| 10714308 | Measurement method and electron microscope | — | 2020-07-14 |