Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10664370 | Multiple core analysis mode for defect analysis | Kenji Shiozawa, Yoshihide Nakamura, Yutaka Nakadai, Tetsuya Kokubun, Hiroyuki Sasaki | 2020-05-26 |
| 10656201 | Semiconductor device | Tetsuya Kokubun, Yutaka Nakadai, Kenji Shiozawa, Yoshihide Nakamura | 2020-05-19 |