Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10663487 | Low force wafer test probe with variable geometry | David M. Audette, Dennis R. Conti, Grant Wagner | 2020-05-26 |
MK
Marc D. Knox
Overall (2020): #362,147 of 565,922Top 65%
1
Patents 2020