Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10734334 | Coaxial-interconnect structure for a semiconductor component | Lijuan Zhang | 2020-08-04 |
| 10620236 | Multi-test type probe card and corresponding testing system for parallel testing of dies via multiple test sites | David Ganapol, Michael Gonia, Scott Wu | 2020-04-14 |