| 10784200 |
Ionizing radiation blocking in IC chip to reduce soft errors |
Mukta G. Farooq, Ian D. Melville, Kevin S. Petrarca |
2020-09-22 |
| 10727121 |
Thin film interconnects with large grains |
Robert L. Bruce, Cyril Cabral, Jr., Gregory M. Fritz, Eric A. Joseph, Michael F. Lofaro +2 more |
2020-07-28 |
| 10633280 |
Chemically strengthened glass and methods of making same |
Qiang Huang, Asli Sahin |
2020-04-28 |
| 10634797 |
Real time X-ray dosimeter using diodes with variable thickness degrader |
Michael S. Gordon, John G. Massey |
2020-04-28 |
| 10627529 |
Real time X-ray dosimeter using diodes with variable thickness degrader |
Michael S. Gordon, John G. Massey |
2020-04-21 |
| 10566297 |
Monolithic integration of III-V cells for powering memory erasure devices |
Davood Shahrjerdi |
2020-02-18 |
| 10535618 |
Tamper-proof electronic packages with stressed glass component substrate(s) |
James A. Busby, Silvio Dragone, Michael A. Gaynes, William Santiago-Fernandez |
2020-01-14 |
| 10535713 |
Integrated reactive material erasure element with phase change memory |
Matthew J. BrightSky, Cyril Cabral, Jr. |
2020-01-14 |
| 10535619 |
Tamper-proof electronic packages with stressed glass component substrate(s) |
James A. Busby, Silvio Dragone, Michael A. Gaynes, William Santiago-Fernandez |
2020-01-14 |
