Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10679340 | Inspection method and system | Wei Fang, Zhao-Li Zhang | 2020-06-09 |
| 10586681 | Charged particle beam apparatus | Zhongwei Chen, Weiming Ren | 2020-03-10 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10679340 | Inspection method and system | Wei Fang, Zhao-Li Zhang | 2020-06-09 |
| 10586681 | Charged particle beam apparatus | Zhongwei Chen, Weiming Ren | 2020-03-10 |