EF

Erik Franken

FE Fei: 2 patents #6 of 98Top 7%
📍 Nuenen, NL: #3 of 23 inventorsTop 15%
Overall (2020): #175,985 of 565,922Top 35%
2
Patents 2020

Issued Patents 2020

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10825647 Innovative imaging technique in transmission charged particle microscopy Bart Jozef Janssen, Lingbo Yu 2020-11-03
10665419 Intelligent pre-scan in scanning transmission charged particle microscopy Ivan Lazic, Bart Jozef Janssen 2020-05-26