Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10770258 | Method and system for edge-of-wafer inspection and review | Xinrong Jiang, Christopher Sears, Harsh Sinha, David Trease, Wei Ye | 2020-09-08 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10770258 | Method and system for edge-of-wafer inspection and review | Xinrong Jiang, Christopher Sears, Harsh Sinha, David Trease, Wei Ye | 2020-09-08 |