Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10614262 | Method of predicting areas of vulnerable yield in a semiconductor substrate | Raman K. Nurani, Koushik Ragavan, Karanpreet Aujla | 2020-04-07 |
| 10579041 | Semiconductor process control method | Raman K. Nurani, Koushik Ragavan | 2020-03-03 |
| 10579769 | Using design proximity index and effect-to-design proximity ratio to control semiconductor processes and achieve enhanced yield | Raman K. Nurani, Koushik Ragavan | 2020-03-03 |