Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10598696 | Probe pins with etched tips for electrical die test | Joseph D. Stanford, David Craig, Mohit Mamodia, Dingying Xu | 2020-03-24 |
| 10578647 | Probes for wafer sorting | Jin Yang, Donald E. Edenfeld | 2020-03-03 |