Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10677845 | Converged test platforms and processes for class and system testing of integrated circuits | Abram M. Detofsky, Evan M. Fledell, Mustapha Amadu Abdulai, John M. Peterson, Dinia P. Kitendaugh +2 more | 2020-06-09 |