Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10859534 | System and method for examining semiconductor substrates | Sebastian Bernrieder, Marianne Unterreitmeier | 2020-12-08 |
| 10598480 | Wafer probing | Ivan Penjovic | 2020-03-24 |
ON
Oliver Nagler
Overall (2020): #135,067 of 565,922Top 25%
2
Patents 2020