Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10879035 | Scanning electron microscope and measurement method for obtaining images of a specimen using an ion beam and an electron beam | Toshikatsu Kaneyama | 2020-12-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10879035 | Scanning electron microscope and measurement method for obtaining images of a specimen using an ion beam and an electron beam | Toshikatsu Kaneyama | 2020-12-29 |