Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10634629 | Techniques for using oxide thickness measurements for predicting crack formation and growth history in high-temperature metallic components | Ralph Edward Huneycutt, IV, Kee Bong Yoon | 2020-04-28 |