Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10782340 | Dynamic response analysis prober device | Masaaki Komori, Katsuo Oki, Takayuki Mizuno | 2020-09-22 |
| 10712384 | Circuit inspection method and sample inspection apparatus | Akira Kageyama | 2020-07-14 |